Problems in the analysis of semiconductor device materials exposed to ionizing radiation.
| Autor: | Schmidt, P.F., McCaughan, D.V., Kushner, R.A. |
|---|---|
| Zdroj: | Proceedings of the IEEE; 1974, Vol. 62 Issue 9, p1220-1223, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|