Prediction of product yield distributions from wafer parametric measurements of CMOS circuits.
| Autor: | Mizrukhin, L., Heuy, J., Mehta, S. |
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| Zdroj: | IEEE Transactions on Semiconductor Manufacturing; 1992, Vol. 5 Issue 2, p88-93, 6p |
| Databáze: | Complementary Index |
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