Single-event phenomena in GaAs devices and circuits.

Autor: McMorrow, D., Weatherford, T.R., Buchner, S., Knudson, A.R., Melinger, J.S., Lan Hu Tran, Campbell, A.B.
Zdroj: IEEE Transactions on Nuclear Science; 1996, Vol. 43 Issue 2, p628-644, 17p
Databáze: Complementary Index