Single-event phenomena in GaAs devices and circuits.
Autor: | McMorrow, D., Weatherford, T.R., Buchner, S., Knudson, A.R., Melinger, J.S., Lan Hu Tran, Campbell, A.B. |
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Zdroj: | IEEE Transactions on Nuclear Science; 1996, Vol. 43 Issue 2, p628-644, 17p |
Databáze: | Complementary Index |
Externí odkaz: |