Hardness-assurance issues for lateral PNP bipolar junction transistors.
| Autor: | Schrimpf, R.D., Graves, R.J., Schmidt, D.M., Fleetwood, D.M., Pease, R.L., Combs, W.E., DeLaus, M. |
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| Zdroj: | IEEE Transactions on Nuclear Science; 1995, Vol. 42 Issue 6, p1641-1649, 9p |
| Databáze: | Complementary Index |
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