Analysis of neutron damage in high-temperature silicon carbide JFETs.
| Autor: | McLean, F.B., McGarrity, J.M., Scozzie, C.J., Tipton, C.W., DeLancey, W.M. |
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| Zdroj: | IEEE Transactions on Nuclear Science; 1994, Vol. 41 Issue 6, p1884-1894, 11p |
| Databáze: | Complementary Index |
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