An SEU Tolerant Memory Cell Derived from Fundamental Studies of SEU Mechanisms in SRAM.

Autor: Weaver, H. T., Axness, C. L., McBrayer, J. D., Browning, J. S., Fu, J. S., Ochoa, A., Koga, R.
Zdroj: IEEE Transactions on Nuclear Science; 1987, Vol. 34 Issue 6, p1281-1286, 6p
Databáze: Complementary Index