Charge Collection Efficiency Related to Damage in MOS Capaciors.
| Autor: | Xapsos, Michael A., Campbell, Arthur B., Knudson, Alvin R., Stapor, William J., Shapiro, Philip, Palmer, Tawanna, McDonald, Patrick T., Swickert, Suzanne L. |
|---|---|
| Zdroj: | IEEE Transactions on Nuclear Science; 1987, Vol. 34 Issue 6, p1214-1219, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|