A Proposed Scheme for Measuring and Categorizing the Total Ionizing Radiation Dose Response of MOS Devices.
| Autor: | Boesch, H. Edwin |
|---|---|
| Zdroj: | IEEE Transactions on Nuclear Science; 1986, Vol. 33 Issue 6, p1337-1342, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|