Total Dose Indujced Hole Trapping and Interface State Generation in Bipolar Recessed Field Oxides.
| Autor: | Pease, R., Emily, D., Boesch, H. E. |
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| Zdroj: | IEEE Transactions on Nuclear Science; 1985, Vol. 32 Issue 6, p3946-3952, 7p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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