A High Resolution Wire Scanner Beam Profile Monitor with a Microprocessor Data Acquisition System.

Autor: Cutler, R. I., Mohr, D. L., Whittaker, J. K., Yoder, N. R.
Zdroj: IEEE Transactions on Nuclear Science; 1983, Vol. 30 Issue 4, p2213-2215, 3p
Databáze: Complementary Index