Temperature Effects on Failure and Annealing Behavior in Dynamic Random Access Memories.
| Autor: | Wilkin, Neil D., Self, Charles T. |
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| Zdroj: | IEEE Transactions on Nuclear Science; 1982, Vol. 29 Issue 6, p1669-1673, 5p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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