Transient Radiation Effects Evaluation of the F-8 Microprocessor.
Autor: | Coppage, F. N., Barnum, J. H., Collins, C., Corbett, W., Measel, P., Wahlin, K. |
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Zdroj: | IEEE Transactions on Nuclear Science; 1981, Vol. 28 Issue 6, p4041-4045, 5p |
Databáze: | Complementary Index |
Externí odkaz: |