Relative Roles of Charge Accumulation and Interface States in Surface Degradation (NPN Planar Transistors).
| Autor: | Sivo, Louis L. |
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| Zdroj: | IEEE Transactions on Nuclear Science; 1972, Vol. 19 Issue 6, p305-312, 8p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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