Influence of Trapping and Detrapping Effects in Si(Li), Ge(Li) and CdTe Detectors.
Autor: | Mayer, J. W., Martini, M., Zanio, K. R., Fowler, I. L. |
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Zdroj: | IEEE Transactions on Nuclear Science; 1970, Vol. 17 Issue 3, p221-234, 14p |
Databáze: | Complementary Index |
Externí odkaz: |