Influence of Trapping and Detrapping Effects in Si(Li), Ge(Li) and CdTe Detectors.

Autor: Mayer, J. W., Martini, M., Zanio, K. R., Fowler, I. L.
Zdroj: IEEE Transactions on Nuclear Science; 1970, Vol. 17 Issue 3, p221-234, 14p
Databáze: Complementary Index