Bias, frequency, and area dependencies of high frequency noise in AlGaAs/GaAs HBT's.

Autor: Liou, J.J., Jenkins, T.J., Liou, L.L., Neidhard, R., Barlage, D.W., Fitch, R., Barrette, J.P., Mack, M., Bozada, C.A., Lee, R.H.Y., Dettmer, R.W., Sewell, J.S.
Zdroj: IEEE Transactions on Electron Devices; 1996, Vol. 43 Issue 1, p116-122, 7p
Databáze: Complementary Index