Analytical and experimental studies of thermal noise in MOSFET's.
Autor: | Tedja, S., Van der Spiegel, J., Williams, H.H. |
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Zdroj: | IEEE Transactions on Electron Devices; 1994, Vol. 41 Issue 11, p2069-2075, 7p |
Databáze: | Complementary Index |
Externí odkaz: |