Detailed analysis of edge effects in SIMOX-MOS transistors.
| Autor: | Elewa, T., Kleveland, B., Cristoloveanu, S., Boukriss, B., Chovet, A. |
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| Zdroj: | IEEE Transactions on Electron Devices; 1992, Vol. 39 Issue 4, p874-882, 9p |
| Databáze: | Complementary Index |
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