Dual-type CMOS gate electrodes by dopant diffusion from silicide.

Autor: Nygren, S., Amm, D.T., Levy, D., Torres, J., Goltz, G., d'Ouville, T.T., Delpech, P.
Zdroj: IEEE Transactions on Electron Devices; 1989, Vol. 36 Issue 6, p1087-1093, 7p
Databáze: Complementary Index