Suppression of hot-carrier effects in submicrometer surface-channel PMOSFETs.

Autor: Brassington, M.P., Poulter, M.W., El-Diwany, M.
Zdroj: IEEE Transactions on Electron Devices; 1988, Vol. 35 Issue 7, p1149-1151, 3p
Databáze: Complementary Index