Multiple-zone single-mask junction termination extension—A high-yield near-ideal breakdown voltage technology.
| Autor: | Tantraporn, W., Temple, V.A.K. |
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| Zdroj: | IEEE Transactions on Electron Devices; 1987, Vol. 34 Issue 10, p2200-2210, 11p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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