Measurement and modeling of circuit speed of CMOS on oxygen-implanted SOI.
| Autor: | Davis, J.R., Hopper, G.F., Reeson, K.J., Hemment, P.L.F. |
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| Zdroj: | IEEE Transactions on Electron Devices; 1987, Vol. 34 Issue 8, p1713-1718, 6p |
| Databáze: | Complementary Index |
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