Hot-electron-induced degradation in MOSFET's at 77 K.
| Autor: | Bracchitta, J.A., Honan, T.L., Anderson, R.L. |
|---|---|
| Zdroj: | IEEE Transactions on Electron Devices; 1985, Vol. 32 Issue 9, p1850-1857, 8p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Bracchitta, J.A., Honan, T.L., Anderson, R.L. |
|---|---|
| Zdroj: | IEEE Transactions on Electron Devices; 1985, Vol. 32 Issue 9, p1850-1857, 8p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|