Measurement of minimum-geometry MOS transistor capacitances.
| Autor: | Paulos, J.J., Antoniadis, D.A. |
|---|---|
| Zdroj: | IEEE Transactions on Electron Devices; 1985, Vol. 32 Issue 2, p357-363, 7p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
| Autor: | Paulos, J.J., Antoniadis, D.A. |
|---|---|
| Zdroj: | IEEE Transactions on Electron Devices; 1985, Vol. 32 Issue 2, p357-363, 7p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|