A soft error rate model for MOS dynamic RAM's.
| Autor: | Toyabe, T., Shinoda, T., Aoki, M., Kawamoto, H., Mitsusada, K., Masuhara, T., Asai, S. |
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| Zdroj: | IEEE Transactions on Electron Devices; 1982, Vol. 29 Issue 4, p732-737, 6p |
| Databáze: | Complementary Index |
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