Control of gate—Drain avalanche in GaAs MESFET's.

Autor: Wemple, S.H., Niehaus, W.C., Cox, H.M., DiLorenzo, J.V., Schlosser, W.O.
Zdroj: IEEE Transactions on Electron Devices; 1980, Vol. 27 Issue 6, p1013-1018, 6p
Databáze: Complementary Index