Thermal stability and secondary breakdown in planar power MOSFET's.
| Autor: | Yoshida, I., Okabe, T., Katsueda, M., Ochi, S., Nagata, M. |
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| Zdroj: | IEEE Transactions on Electron Devices; 1980, Vol. 27 Issue 2, p395-398, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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