A new approach to the simulation of the coupled point defects and impurity diffusion.
| Autor: | Rorris, E., O'Brien, R.R., Morehead, F.F., Lever, R.F., Peng, J.P., Srinivasan, G.R. |
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| Zdroj: | IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; 1990, Vol. 9 Issue 10, p1113-1122, 10p |
| Databáze: | Complementary Index |
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