Influence of grain size on the transport properties of Ni/sub 80/Fe/sub 20/ and Cu thin films.

Autor: Rijks, T.G.S.M., Sour, R.L.H., Neerinck, D.G., De Veirman, A.E.M., Coehoorn, R., Kools, J.C.S., Gillies, M.F., de Jonge, W.J.M.
Zdroj: IEEE Transactions on Magnetics; 1995, Vol. 31 Issue 6, p3865-3867, 3p
Databáze: Complementary Index