Application of elliptic Fourier descriptors to symmetry detection under parallel projection.
| Autor: | Yip, R.K.K., Tam, P.K.S., Leung, D.N.K. |
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| Zdroj: | IEEE Transactions on Pattern Analysis & Machine Intelligence; 1994, Vol. 16 Issue 3, p277-286, 10p |
| Databáze: | Complementary Index |
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