| Autor: |
Netel, H., Jochum, J., Labov, S.E., Mears, C.A., Frank, M., Chow, D., Lindeman, M.A., Hiller, L.J. |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Applied Superconductivity; 1997, Vol. 7 Issue 2, p3379-3382, 4p |
| Abstrakt: |
We have fabricated Ag/Al/sub 2/O/sub 3//Al tunnel junctions on Si substrates using a new process. This process was developed to fabricate superconducting tunnel junctions (STJs) on the surface of a superconductor. These junctions allow us to study the proximity effect of a superconducting Al film on a normal metal trapping layer. In addition, these devices allow us to measure the hot-electron diffusion constant using a single junction. Lastly these devices will help us optimize the design and fabrication of tunnel junctions on the surface of high-Z, ultra-pure superconducting crystals. [ABSTRACT FROM PUBLISHER] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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