| Autor: |
Akimov, I.I., Antipova, E.V., Barabanov, S.N., Kozlenkova, N.I., Kuznetsov, P.A., Nikulin, A.D., Rakov, D.N., Shikov, A.K., Khlebova, N.E., Filitchev, D.A. |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Applied Superconductivity; 1997, Vol. 7 Issue 2, p1323-1326, 4p |
| Abstrakt: |
The effect of bending strain on Voltage-Current Characteristics (VCC) of BiPbSrCaCuO-2223/(Ag and Ag-alloy sheathed) tapes with and without Ag additions into the core have been studied. The testing probe allows us to carry out all set of bending tests up to radius 5 mm on the same specimen. The critical current Ic and shape of high-sensitivity VCC as a function of bending strain are analysed. Degradation of current carrying capacity under bending deformation is caused by the formation of microcracks. The overlapping of microcracks in Bi-2223/Ag sheathed tapes without Ag additions leads to current overflow into the Ag sheath and to appearance of linear resistance segment in the V-I curve at low electric field. [ABSTRACT FROM PUBLISHER] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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