Managing test coverage uncertainty due to thermal noise in nano-CMOS: A case-study on an SRAM array.
| Autor: | Suresh, Vikram B., Kundu, Sandip |
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| Zdroj: | 2013 IEEE 31st International Conference on Computer Design (ICCD); 2013, p201-206, 6p |
| Databáze: | Complementary Index |
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