Current generator for testing power semiconductor devices in high conduction state.
| Autor: | Bespalov, N. N., Ilyin, M. V., Kapitonov, S. S. |
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| Zdroj: | 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE); 2012, p143-146, 4p |
| Databáze: | Complementary Index |
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