A novel test structure for measuring the threshold voltage variance in MOSFETs.
| Autor: | Yamaguchi, Takahiro J., Tandon, James S., Komatsu, Satoshi, Asada, Kunihiro |
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| Zdroj: | 2013 IEEE International Test Conference (ITC); 2013, p1-8, 8p |
| Databáze: | Complementary Index |
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