Taming complexity while gaining efficiency: Requirements for the next generation of test automation tools.
| Autor: | Bansal, Abhijit, Muli, Mahendra, Patil, Kunal |
|---|---|
| Zdroj: | 2013 IEEE Autotestcon; 2013, p1-6, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Bansal, Abhijit, Muli, Mahendra, Patil, Kunal |
|---|---|
| Zdroj: | 2013 IEEE Autotestcon; 2013, p1-6, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|