A new approach to the biasing problem and the fault localization of nonlinear electronic circuits.
| Autor: | Theeuwen, J., Jess, J. |
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| Zdroj: | IEEE Transactions on Circuits & Systems; 1982, Vol. 29 Issue 3, p125-135, 11p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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