Cosmic ray soft error rates of 16-Mb DRAM memory chips.

Autor: Ziegler, J.F., Nelson, M.E., Shell, J.D., Peterson, R.J., Gelderloos, C.J., Muhlfeld, H.P., Montrose, C.J.
Zdroj: IEEE Journal of Solid-State Circuits; 1998, Vol. 33 Issue 2, p246-252, 7p
Databáze: Complementary Index