Flexible test mode approach for 256-Mb DRAM.
| Autor: | Kirihata, T., Hing Wong, DeBrosse, J.K., Watanabe, Y., Hara, T., Yoshida, M., Wordeman, M.R., Fujii, S., Asao, Y., Krsnik, B. |
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| Zdroj: | IEEE Journal of Solid-State Circuits; 1997, Vol. 32 Issue 10, p1525-1534, 10p |
| Databáze: | Complementary Index |
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