Analysis and prevention of DRAM latch-up during power-on.
| Autor: | Young-Hee Kim, Jae-Yoon Sim, Hong June Park, Jae-Ik Doh, Kun-Woo Park, Hyun-Woong Chung, Jong-Hoon Oh, Choon-Sik Oh, Seung-Han Ahn |
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| Zdroj: | IEEE Journal of Solid-State Circuits; 1997, Vol. 32 Issue 1, p79-85, 7p |
| Databáze: | Complementary Index |
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