Advanced modeling of distortion effects in bipolar transistors using the Mextram model.
| Autor: | De Vreede, N., De Graaff, H.C., Mouthaan, K., De Kok, M., Tauritz, J.L., Baets, R.G.F. |
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| Zdroj: | IEEE Journal of Solid-State Circuits; 1996, Vol. 31 Issue 1, p114-121, 8p |
| Databáze: | Complementary Index |
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