The effects of BJT self-heating on circuit behavior.
Autor: | Fox, R.M., Lee, S.-G., Zweidinger, D.T. |
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Zdroj: | IEEE Journal of Solid-State Circuits; 1993, Vol. 28 Issue 6, p678-685, 8p |
Databáze: | Complementary Index |
Externí odkaz: |
Autor: | Fox, R.M., Lee, S.-G., Zweidinger, D.T. |
---|---|
Zdroj: | IEEE Journal of Solid-State Circuits; 1993, Vol. 28 Issue 6, p678-685, 8p |
Databáze: | Complementary Index |
Externí odkaz: |