Design of a self-testing and self-repairing structure for highly hierarchical ultra-large capacity memory chips.
| Autor: | Chen, T., Sunada, G. |
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| Zdroj: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems; 1993, Vol. 1 Issue 2, p88-97, 10p |
| Databáze: | Complementary Index |
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