Kinetics of copper drift in PECVD dielectrics.
Autor: | Loke, A.L.S., Changsup Ryu, Yue, C.P., Cho, J.S.H., Wong, S.S. |
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Zdroj: | IEEE Electron Device Letters; 1996, Vol. 17 Issue 12, p549-551, 3p |
Databáze: | Complementary Index |
Externí odkaz: |
Autor: | Loke, A.L.S., Changsup Ryu, Yue, C.P., Cho, J.S.H., Wong, S.S. |
---|---|
Zdroj: | IEEE Electron Device Letters; 1996, Vol. 17 Issue 12, p549-551, 3p |
Databáze: | Complementary Index |
Externí odkaz: |