Use of noise thermometry to study the effects of self-heating in submicrometer SOI MOSFETs.
| Autor: | Bunyan, R.J.T., Uren, M.J., Alderman, J.C., Eccleston, W. |
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| Zdroj: | IEEE Electron Device Letters; 1992, Vol. 13 Issue 5, p279-281, 3p |
| Databáze: | Complementary Index |
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