Degradation in thin-film SOI MOSFET's caused by single-transistor latch.
| Autor: | Bunyan, R.J.T., Uren, M.J., Thomas, N.J., Davis, J.R. |
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| Zdroj: | IEEE Electron Device Letters; 1990, Vol. 11 Issue 9, p359-361, 3p |
| Databáze: | Complementary Index |
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