A selectively deposited poly-gate ITLDD process with self-aligned LDD/channel implantation.

Autor: Pfiester, J.R., Baker, F.K., Sivan, R.D., Crain, N., Lin, J.-H., Liaw, M., Seelbach, C., Gunderson, C., Denning, D.
Zdroj: IEEE Electron Device Letters; 1990, Vol. 11 Issue 6, p253-255, 3p
Databáze: Complementary Index