A gate probe method of determining parasitic resistance in MESFET's.
| Autor: | Holmstrom, R.P., Bloss, W.L., Chi, J.Y. |
|---|---|
| Zdroj: | IEEE Electron Device Letters; 1986, Vol. 7 Issue 7, p410-412, 3p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Holmstrom, R.P., Bloss, W.L., Chi, J.Y. |
|---|---|
| Zdroj: | IEEE Electron Device Letters; 1986, Vol. 7 Issue 7, p410-412, 3p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|