Fully isolated lateral bipolar—MOS transistors fabricated in zone-melting-recrystallized Si films on SiO2.

Autor: Tsaur, B.-Y., Silversmith, D.J., Fan, J.C.C., Mountain, R.W.
Zdroj: IEEE Electron Device Letters; 1983, Vol. 4 Issue 8, p269-271, 3p
Databáze: Complementary Index