Impact ionization phenomenon in 0.1 /spl mu/m MOSFET at low temperature and low voltage.
| Autor: | Koyanagi, M., Matsumoto, T., Tsuno, M., Shimatani, T., Yoshida, Y., Watanabe, H. |
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| Zdroj: | Proceedings of IEEE International Electron Devices Meeting; 1993, p341-344, 4p |
| Databáze: | Complementary Index |
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