Critical charge model for transient latch-up in VLSI CMOS circuits.
| Autor: | Reczek, W., Winnerl, J., Pribyl, W. |
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| Zdroj: | Proceedings of the 1989 International Conference on Microelectronic Test Structures; 1989, p251-254, 4p |
| Databáze: | Complementary Index |
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